Surface mounted piezoelectric devices for frequency control and selection
Active in the technical committee
Technical Officer:
de la Fuente, Beatriz
Technical committee
CEB-BEC 49, TC 49, CLC/SR 49
Scope
To prepare standards for piezoelectric, dielectric and electrostatic devices for frequency control, selection and detection.
The most recent standards
- IEC 63541:2025 - Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- IEC 60122-2:2025 - Quartz crystal units of assessed quality - Part 2: Guidelines for the use
- IEC 62276:2025 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- IEC TS 61994-5:2023 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
- IEC TS 61994-5:2023 RLV - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
- IEC 62604-2:2022 - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
- IEC 62604-2:2022 RLV - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use