Nanotechnologie-normalisatie voor elektrische en elektronische producten en systemen
Actief in het technisch comité
Technical Officer:
Vinckx, Luc
Technisch comité
CEB-BEC 113
Korte omschrijving
Nanogestructureerde captoren, nano-elektronica, opto-elektronische toestellen, organische elektronica, magnetische materialen, radio-frequentietoestellen, elektrotechnische eigenschappen van nanobuizen en nanodraden, brandstofbatterijen en elektromedische toepassingen.
De meest recente normen
- IEC TS 62607-6-4:2024 - Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Surface conductance: non-contact microwave resonant cavity method
- IEC TS 62607-8-3:2023 - Nanomanufacturing - Key control characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices - Analog resistance change and resistance fluctuation: Electrical resistance measurement
- IEC TS 62607-7-2:2023 - Nanomanufacturing - Key control characteristics - Part 7-2: Nano-enabled photovoltaics - Device evaluation method for indoor light
- ISO 80004-1:2023 - Nanotechnologies - Vocabulaire - Partie 1: Vocabulaire "cœur"
- IEC TS 62607-6-7:2023 - Nanomanufacturing - Key control characteristics - Part 6-7: Graphene - Sheet resistance: van der Pauw method
- IEC TS 62607-6-8:2023 - Nanomanufacturing - Key control characteristics - Part 6-8: Graphene - Sheet resistance: In-line four-point probe
- IEC TS 62565-5-1:2023 - Nanomanufacturing - Product specifications - Part 5-1: Nanoporous activated carbon - Blank detail specification: Electrochemical capacitors
- IEC TS 62565-1:2023 - Nanomanufacturing - Product specifications - Part 1: Basic concepts
- IEC TS 62607-6-17:2023 - Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy
- IEC TS 62607-6-2:2023 - Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy